Compliance Testing for Random Effects Models With Joint Acceptance CriteriaLINKLETTER, Crystal D; DEVON LIN, C; BRENNEMAN, William A et al.Technometrics. 2012, Vol 54, Num 3, pp 243-255, issn 0040-1706, 13 p.Article

Massive Dataset Analysis for NASA's Atmospheric Infrared SounderBRAVERMAN, Amy J; FETZER, Eric J; KAHN, Brian H et al.Technometrics. 2012, Vol 54, Num 2, pp 1-15, issn 0040-1706, 15 p.Article

Massive Dataset Analysis for NASA's Atmospheric Infrared SounderBRAVERMAN, Amy J; FETZER, Eric J; KAHN, Brian H et al.Technometrics. 2012, Vol 54, Num 1, pp 1-15, issn 0040-1706, 15 p.Article

Noncollapsing Space-Filling Designs for Bounded Nonrectangular RegionsDRAGULJIC, Danel; SANTNER, Thomas J; DEAN, Angela M et al.Technometrics. 2012, Vol 54, Num 2, pp 169-178, issn 0040-1706, 10 p.Article

Computationally Efficient Comparison of Experimental Designs for System Reliability Studies With Binomial DataCHAPMAN, Jessica L; MORRIS, Max D; ANDERSON-COOK, Christine M et al.Technometrics. 2012, Vol 54, Num 4, pp 410-424, issn 0040-1706, 15 p.Article

Staggered-Level Designs for Experiments With More Than One Hard-to-Change FactorARNOUTS, Heidi; GOOS, Peter.Technometrics. 2012, Vol 54, Num 4, pp 355-366, issn 0040-1706, 12 p.Article

Efficient MCMC Schemes for Computationally Expensive Posterior DistributionsFIELDING, Mark; NOTT, David J; LIONG, Shie-Yui et al.Technometrics. 2011, Vol 53, Num 1, pp 16-28, issn 0040-1706, 13 p.Article

Inference for the Lognormal Mean and Quantiles Based on Samples With Left and Right Type I CensoringKRISHNAMOORTHY, K; MALLICK, Avishek; MATHEW, Thomas et al.Technometrics. 2011, Vol 53, Num 1, pp 72-83, issn 0040-1706, 12 p.Article

A Computationally Stable Approach to Gaussian Process Interpolation of Deterministic Computer Simulation DataRANJAN, Pritam; HAYNES, Ronald; KARSTEN, Richard et al.Technometrics. 2011, Vol 53, Num 4, pp 366-378, issn 0040-1706, 13 p.Article

Bayesian Local Contamination Models for Multivariate OutliersPAGE, Garritt L; DUNSON, David B.Technometrics. 2011, Vol 53, Num 2, pp 152-162, issn 0040-1706, 11 p.Article

Seasonal Dynamic Factor Analysis and Bootstrap Inference: Application to Electricity Market ForecastingALONSO, Andrés M; GARCIA-MARTOS, Carolina; RODRIGUEZ, Julio et al.Technometrics. 2011, Vol 53, Num 2, pp 137-151, issn 0040-1706, 15 p.Article

Simulated Annealing Model Search for Subset Selection in Screening ExperimentsWOLTERS, Mark A; BINGHAM, Derek.Technometrics. 2011, Vol 53, Num 3, pp 225-237, issn 0040-1706, 13 p.Article

A General Criterion for Factorial Designs Under Model UncertaintyTSAI, Pi-Wen; GILMOUR, Steven G.Technometrics. 2010, Vol 52, Num 2, pp 231-242, issn 0040-1706, 12 p.Article

Fraud Detection in Telecommunications: History and Lessons LearnedBECKER, Richard A; VOLINSKY, Chris; WILKS, Allan R et al.Technometrics. 2010, Vol 52, Num 1, pp 20-33, issn 0040-1706, 14 p.Article

Reliability Models for Almost-Series and Almost-Parallel SystemsGRAVES, Todd L; ANDERSON-COOK, Christine M; HAMADA, Michael S et al.Technometrics. 2010, Vol 52, Num 2, pp 160-171, issn 0040-1706, 12 p.Article

A Non-Gaussian Kalman Filter With Application to the Estimation of Vehicular SpeedLI, Baibing.Technometrics. 2009, Vol 51, Num 2, pp 162-172, issn 0040-1706, 11 p.Article

A New and Efficient Estimation Method for the Generalized Pareto DistributionZHANG, Jin; STEPHENS, Michael A.Technometrics. 2009, Vol 51, Num 3, pp 316-325, issn 0040-1706, 10 p.Article

Jump Detection in a Regression Curve and Its DerivativeJOO, Jong-Hoon; QIU, Peihua.Technometrics. 2009, Vol 51, Num 3, pp 289-305, issn 0040-1706, 17 p.Article

Expert Knowledge and Multivariate Emulation: The Thermosphere-lonosphere Electrodynamics General Circulation Model (TIE-GCM)ROUGIER, Jonathan; MAUTE, Astrid; GUILLAS, Serge et al.Technometrics. 2009, Vol 51, Num 4, pp 414-424, issn 0040-1706, 11 p.Article

A Critical Assessment of Two-Stage Group Screening Through Industrial ExperimentationVINE, A. E; LEWIS, S. M; DEAN, A. M et al.Technometrics. 2008, Vol 50, Num 1, pp 15-25, issn 0040-1706, 11 p.Article

A Note on Computing the Probability and Critical Values for the Half-Normal PlotGUIRGUIS, Georges H.Technometrics. 2008, Vol 50, Num 2, pp 228-229, issn 0040-1706, 2 p.Article

Analysis of Window-Observation Recurrence DataZUO, Jianying; MEEKER, William Q; WU, Huaiqing et al.Technometrics. 2008, Vol 50, Num 2, pp 128-143, issn 0040-1706, 16 p.Article

Estimation of Process Parameters to Determine the Optimum Diagnosis Interval for Control of Defective ItemsDASGUPTA, Tirthankar; MANDAL, Abhyuday.Technometrics. 2008, Vol 50, Num 2, pp 167-181, issn 0040-1706, 15 p.Article

Sequential Change-Point Detection Methods for Nonstationary Time SeriesCHOI, Hyunyoung; OMBAO, Hernando; RAY, Bonnie et al.Technometrics. 2008, Vol 50, Num 1, pp 40-52, issn 0040-1706, 13 p.Article

Using Orthogonal Arrays in the Sensitivity Analysis of Computer ModelsMORRIS, Max D; MOORE, Leslie M; MCKAY, Michael D et al.Technometrics. 2008, Vol 50, Num 2, pp 205-215, issn 0040-1706, 11 p.Article